Equipment
Central Services for Scientific and Technological Research (UCA)
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JEOL JEM-2011
Transmission Electron Microscope.
Transmission Electron Microscope.
Transmission Electron Microscope.
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FEI Quanta 200
Scanning Electron Microscope.
Scientific equipment whose responsible researchers are assigned to the IMEYMAT
Preparation of sample
Thermophysical and thermochemical equipment
Spectroscopic techniques
Microscopic techniques
Mechanical and surface characterizations
Optics and optomechanics
IT and computer systems
Magnetic characterizations
Electrical and electronic systems
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Focused Ion Beam (FIB)
TEM sample preparation.
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Supercomputer
lt is a cluster compute, architecture, comprising nodes 80 biprocesadores, each dual-core, so that the total computing cores reaches 320 units, 640 GB of main memory, which makes available an peak of 3.8 TFlops.
Equipment list:
PREPARATION OF SAMPLE |
Investigation Group |
Struers DAP-V monoplane polisher with Pedemin automatic head. Polishing of both direct and embedded samples in epoxy resin. |
FQM166 |
Sample polishing equipment. Equipped with a press for 30 mm diameter pellets. Preparation of samples with optical quality polishing. |
TEP115 |
Sander of double plate Struers mod Labopol-21, Metallographic polisher Rotopol-3 with automatic head. |
TEP120 |
Rotopol-35 metallographic polisher with Rotoforce-4 automatic head and accessories. |
TEP120 |
Struers DAP-V monoplane polisher with Pedemin automatic head. Polishing of both direct and embedded samples in epoxy resin. |
TEP120 |
Sander Struers mod DAP-7, Sander Struers mod Labopol-5, Sander Struers mod Labopol.Lijadora Struers mod Rotopol-35 with automatic spindle. “Concave-convex” grinding machine Dimple Grinder (Gatan: mod 656). |
TEP120 |
Polisher Mod. Dap V Struers. Mod. TL302 MG cutter. Prelijadoras Mod. Nnuth-Rotor-3 of Struers. System for the preparation of metallic samples with optical quality polishing for metallographic studies. |
TEP120 |
Disk cutter Struers miniton. Equipped with a diamond disc and silicon carbide, it allows the cutting of all types of samples of high hardness. |
FQM166 |
Struers disk cutter mod Labotom-3 |
TEP120 |
Disk cutter Struers miniton. Equipped with a diamond disc and silicon carbide, it allows the cutting of all types of samples of high hardness. |
TEP120 |
Ultrasonic disc cutter (Gatan: mod 601). Disk cutter LOGITECH mod 15 SAW. Vertical cutter of diamond wire WELL mod 3242-3. Systems for cutting, gluing, measuring and mechanical thinning for preparation of electron-transparent samples. |
TEP120 |
Precision Cutting Machine Mod. Accutom-2 of Struers. Metal sample preparation system. |
TEP120 |
Hydraulic press Specac. Applicable pressure: up to 15 Tm.cm-2. Preparation of self-supported and diluted tablets with KBr, for application in FTIR spectroscopy studies. |
FQM110 |
Stucker Struers Citopress-1. It allows the stuffing of materials in minutes with transparent thermo-fusible, opaque or conductive resins. |
FQM166 |
Vacuum resin infusion set epovac. It allows the sausage of samples in epoxy resin with deep penetration in the pores for the consolidation of despicable materials. |
FQM166 |
Struers stuffer mod Labopress-3. |
TEP120 |
Press stuffing Mod. Predopress of Struers. Metal sample preparation system. |
TEP120 |
Cutting machine STRUERS |
TEP243 |
Medium power ultrasound generator: 130W to 20KHz sonicator with different heads. |
FQM166 |
Planetary milling machine Fritsch Pulverisette 7. Equipped with two heads for ball jars (agate or stainless steel), it allows the grinding of ceramic samples, construction materials, etc. |
FQM166 |
High power ultrasound generator (600 W) at 20 kHz. Equipped with a stainless steel probe with a 13 mm diameter Ti tip. Preparation of sonosolutions for obtaining sonogels with variation of the energy dose. |
TEP115 |
SONOPULS Ultrasound Probe. |
TEP243 |
Rotavapor Heidolph Laborota 4000. Substance concentration at low pressure. |
FQM166 |
Centrifuge Digicen 20-R. Centrifuging in the range of 0 to 16,500 rpm. |
FQM166 |
Centrifuge KOKUSAN H-103N. Washing and obtaining ceramic powders. |
TEP115 |
Elmasonic S210 Ultrasound Bath |
TEP243 |
THERMOPHYSICAL AND THERMOCHEMICAL EQUIPMENT |
Investigation Group |
2 Thermal Analysis Equipment with detector type TCD. They have a programmable device for pulse injection, temperature controller / programmer, mass flow regulators, and digital data acquisition system. Applicable to studies of Reduction / Oxidation / Programmed Thermal Desorption (RTP, OTP, DTP), Quimisoción in Pulses, OBC (“Oxygen Buffering Capacity”) and OSC (“Oxygen Storage Capacity”). Characterization of catalysts. Redox behavior studies of materials. |
FQM110 |
3 Thermal Analysis Devices-equipped with Quadrupole Mass Spectrometer for gas analysis. They have a programmable device for pulse injection, temperature controller / programmer, mass flow regulators, and digital data acquisition system. Studies of Reduction / Oxidation / Programmed Thermal Desorption (RTP, OTP, DTP), Quimisoción in Pulses, OBC (“Oxygen Buffering Capacity”), and ITK (“Isotopic Transient Kinetics”). They are used in the characterization of catalysts, and in redox behavior studies of materials. |
FQM110 |
Differential scanning calorimeter Model DSC-7. This equipment operates in the temperature range between -175 ºC (cooled with liquid nitrogen) and 725 ºC, with a sweep speed between 0.1 and 500 K / min. |
FQM335 |
Differential scanning calorimeter (DSC) TA INSTRUMENT Q20. This equipment can operate in the temperature range between -180 ºC and 725 ºC. |
TEP946 |
Thermal conductivity meter FOX-200 LASERCOMP. It allows making thickness measurements between 0.025 mm to 51mm with a square sample width of 200mm. The range of temperatures with which this equipment operates ranges from -20ºC to 75ºC. |
TEP946 |
500 mL autoclave reactor operating at 300 atm and 500ºC. Preparation of aerogels using the Ethanol critical point. |
TEP115 |
50 mL autoclave reactor with thermal jacket to operate up to 70º and 300 atm. Preparation of aerogels using the critical point of CO2. |
TEP115 |
High pressure batch reactor, AUTOCLAVE ENGENEERING that can operate at high pressure (up to 230 bar) and temperature (up to 450ºC). Equipped with devices for the controlled addition of reagents and sampling. Studies of catalytic water treatment. |
FQM110 |
Recirculators model Haake Phoenix II P1-C25P from Thermo Scientific. 2 units. Working range from -75 to 200 ºC. Used to thermostatize anodized electrochemical cells. |
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Hinge tubular oven, CHESA, large capacity (100 cm high by 35 cm outer diameter, useful diameter: 6 cm). Tmax of operation 1000 ºC. It has programmer / temperature controller. Studies of catalytic activity of active phases massive or supported in monolithic structures of honeycomb or similar type. Preparation of catalysts and other ceramic materials. |
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Cryogenic bath Julabo F33 with MH head programmable between -30 to 100 ºC and 0.01ºC of resolution. It allows the study of metastability bands in hydroalcoholic solutions. |
FQM166 |
Cold finger Julabo to -30ºC. Generic fluid cooling system. |
FQM166 |
Tubular Carbolite oven with Eurotherm programmer. Generic oven system with a maximum working temperature of 1200ºC and a programmer with 8 ramps. |
FQM166 |
Carbolite CSF-1200 oven with Eurotherm programmer. Generic oven system with a maximum working temperature of 1200ºC and a programmer with 8 ramps. |
FQM166 |
CHESA Tubular Oven. It allows to perform complex thermal treatments in a controlled atmosphere up to 1100ºC. |
FQM335 |
Tubular oven brand CARBOLITE. Maximum temperature 1100ºC. Realization of complex thermal treatments in a controlled atmosphere. |
FQM335 |
3 Ovens, two tubular ones of 1700ºC, and 1200ºC, respectively, and one of muffle, of 1700ºC. Densification of ceramics, treatments in controlled atmosphere. Sintering of massive gels and thin films. |
TEP115 |
Heating plate GATAN mod 623.40002, Heating plate PSELECTA mod Combimax |
TEP120 |
Selected stove |
TEP243 |
Carbolite stove |
TEP243 |
Professional thermographic camera Testo, model 875-2i. It has a thermal sensitivity of 0.05ºC. Automatic detection of hot and cold spots and optional temperature measurement up to +550 ° C. Parallel to the thermal image, a real image can be generated, thanks to the integrated digital camera. |
TEP946 |
SPECTROSCOPIC TECHNIQUES |
Investigation Group |
Perkin-Elmer UV / VIS / NIR spectrophotometer, Lambda 19. This double beam spectrophotometer covers the spectral range from 175 nm to 3,200 nm. |
FQM154 |
Double UV-Vis Ocean Optics spectrophotometer, by optical fiber of 0.5 nm and 0.25 nm resolution. External, modular and capable of being connected to a laptop, it is a versatile tool for field measurements. |
FQM166 |
UV-Vis Ocean Optics Spectrophotometer, by optical fiber of 0.5 nm resolution with adaptation for cuvettes by transmittance and reflectance. It is tuned in the range 200-700 nm. The use of cuvettes for reflectance measurement allows you to make fluorescence measurements in solutions. |
FQM166 |
UV-Vis spectrophotometer Otsuka MCPD-1100 fiber optic, 0.6nm resolution and continuous measurement in the range 200-1100nm.Dotted with visible and UV source, allows to obtain spectra from 200 to 1100 nm. It has associated a software that allows the parameterization of the color. Being fiber optic allows the measurement of any type of sample, being equipped, in addition, with a fiber for the measurement of liquids by immersion. |
FQM166 |
Vis Ocean Optics Spectrophotometer, by optical fiber of 0.5 nm resolution with specular reflectance immersion probe. It is tuned in the 350-850 nm range, which gives it a special qualification for the parametric determination of color in liquids. |
FQM166 |
Vis Ocean Optics spectrophotometer, by optical fiber of 0.5 nm resolution with probe for diffuse reflectance. It is tuned in the 350-850 nm range, which gives it a special qualification for the parametric determination of color in solids. |
FQM166 |
Monochromator CVI DK-242 of 1 / 4m with triple turret of diffraction gratings and photodetectors of Si and Ge for the work in the UV-Vis-NIR. The versatility of its triple turret and the possibility of using detectors Si and Ge, allow you to perform any type of electronic spectroscopy measurement in the range 200-1300nm. |
FQM166 |
AVANTES SD-2000 fiber optic spectrophotometer with deuterium sources, laser (400 and 532 nm) and LEDs (375-650nm). Absorption and fluorescence measurements with fiber optic probes. |
FQM335 |
Spectrophotometer UV-VIS Cary 1E with range 250-900 nm. Study of the optical density in massive gels and thin films. Equipped with sample holders for liquid trays. Accessory for specular reflectance. |
TEP115 |
FTIR spectrometer, Mattson 5020, equipped with a double detector type DTGS. It has a DRIFT camera (“Diffuse reflectance”) that allows operating in controlled conditions of pressure and temperature. Quartz cells for the study of self-supported samples under controlled conditions of pressure and temperature. Coupled to a high vacuum system. Characterization studies of catalysts (supported metals, massive and supported oxides) by means of the investigation of adsorbed phases. Especially H2, D2, CO, and CO2. |
FQM110 |
Perkin-Elmer System 2000 FT-IR spectrometer. This Fourier transform IR spectrometer covers the range from 15,600 cm-1 to 20 cm-1. |
FQM154 |
FTIR Nicolet Impact 410 spectrometer with sample holder for the study by transmittance, diffuse reflectance, specular reflectance and thin film between crystals. Study of all types of samples in condensed phase. Equipped with a double micrometric displacement platform allows positional study of large samples. Its software incorporates all the important libraries of spectra such as Aldrich condensed Phase, Vapor phase, organic compounds, etc., Commercial Materials, Coating technology, Hummel polymer, Sigma, Sprouse scientific, Synthetic fibers by microscope, Toronto forensic, U.S. Geological Survey, etc. |
FQM166 |
Raman spectrometer with microprobe. Double spectrometer monochromator Jobin Yvon U-1000 in Czerni-Turner high dispersion assembly with dual holographic network, quadruple slit, and sinus drive. Controllable system by computer. All kinds of Raman-laser molecular spectroscopy. Having a modular sample chamber can be adapted to the study of all types of samples. The use of He-Ne and / or Ar + lasers allows the study in all the visible range for both normal and high fluorescence samples. Recently, a microprobe system has been incorporated for the analysis of samples in the range of micrometers. |
FQM166 |
FTIR IR-plan Microscope Spectra Tech mod. Advantage with resolution of 7 microns and double confocal objective Casegrain for work by transmittance and / or reflectance. Motorized platform for sample mapping. Diamond ATR objective. System coupled to the Nicolet Impact spectrophotometer. It allows the study of all types of micro samples in condensed phase. Ability to perform sample mapping with a minimum step size of 1 micron. Equipped with the ATR objective, it allows non-destructive analysis of micrometer-scale surfaces (analysis of coatings, Si solar cells, etc.) without the need for prior sample preparation. |
FQM166 |
Spectrometer FT-IR Bruker Tensor 37 Dual Range. Spectral resolution of 0.6 cm-1. It is provided with an interchangeable head that allows to work in the range of Medium Infrared (MIR, 7800-370 cm-1) or Near Infrared (NIR, up to 15000 cm-1), with sample holders for the study by transmittance and diffuse reflectance. Study of all types of samples in condensed phase. |
FQM166 |
PTI Quantamaster modular spectrofluorimeter model QM-2000-6SE: This is a T-format spectrofluorimeter, for fluorescence measurements both in steady state and for lifetimes in the nanosecond range. The use of fluorescent markers allows the study of channels in membranes and porous solids or characterization of thin films. In addition, it allows for the characterization of demisters, the determination of lanthanides and the study of solid state fluorophores. |
FQM335 |
Electronic spin resonance spectrometer Varian E-102. Electronic spin resonance (ESR) and Ferromagnetic Resonance (RFM). |
FQM335 |
Spectrophotometer / COLORFLEX Colorimeter |
TEP243 |
Fourier Transform Infrared Spectrophotometer (FTIR) Shimadzu 8400S with ATR |
TEP243 |
MICROSCOPIC TECHNIQUES |
Investigation Group |
NIKON SM2800 Stereoscopic Microscope |
TEP243 |
Eclipse LV150 microscope |
TEP243 |
Nikon tripolar magnifying glass SMZ800 10-60X magnification and C-US2 side stand of bars. For low magnification jobs. |
FQM166 |
Nikon SMZ 2T triocular magnifying glass with 10-60X magnification and C-US2 side stand with bars. For low magnification work, it allows the adaptation of image capture systems and optical fiber input in Otsuka and Ocean Optics spectrophotometers for color determination. |
FQM166 |
Nikon Alphaphot trinocular microscope metallographic / petrographic with 5x, 10x, 20x and 40x objectives. Coaxial intraocular illumination. Versatile system of optical microscopy. It allows the adaptation of image capture systems and optical fiber input in the Otsuka and Ocean Optics spectrophotometers for the determination of color in micrometric samples. |
FQM166 |
Nikon metallographic microscope |
TEP120 |
Optical binocular with zoom (Nikon: mod SMZ-645). Optika optical microscope mod type 102, Nikon optical micropsoprom EPIPHOT 200, Leica mod DMLS optical binocular. Binocular NIKON mod 149777. System of optical accessories for thinning of samples. |
TEP120 |
Nikon optical microscope: mod. Optiphot. System of preparation and study of metallographic specimens. |
TEP120 |
High resolution photoelectric effects microscope (LBIC) for the superficial study of materials with photodependent properties. Self-focusing according to the photopropy studied. Own design system with multiple excitation that allows the measurement of photoelectric properties induced by laser with motorized surface scanning and 1 micron of spatial resolution. Characterization of solar cells with base Si PC and MC. Detection of recombination zones, grain boundaries, dislocations. By means of the specular reflectance sensor it allows its work as a scanning optical microscope for the characterization of phases and the obtaining of images free of optical distortion. |
FQM166 |
Atomic Force Microscope (AFM) Veeco MultiMode capable of working in the following operating modes: (a) AFM in contact mode, (b) AFM friction or lateral force (LFM), (c) AFM in resonant mode, (d) ) AFM without contact, (e) AFM spectroscopy of force curves (Force Volume). Accessories suitable to the mentioned modes of operation, to perform: (1) Measurements in solid and fluid samples, (2) Magnetic force (MFM) and electrical (EFM) measurements perpendicular and parallel to the sample plane (Torsion Mode), in phase and frequency detection, (3) Tunnel-effect spectroscopy measurements (STM), (4) Surface conductivity measurements (C-AFM), (5) Electrochemical measurements with potentiostatic control, (6) Measurements at higher temperatures to the environment, under conditions of thermal equilibrium, up to 250ºC, heating both the sample and the tip of the probe. |
FQM335 |
Focused Ion Beam Equipment (FIB) Dual Beam QUANTA 3D. The basic equipment includes a motorized stage in the five axes, a microscope control computer with two 19 “monitors, a support computer, an electronic column with tungsten filament, a column of Ga + ions, a secondary electron detector for the three vacuum modes (SED, LF-GSED, GSED), an infrared CCD camera, software for generating reports and archiving data, with an oil-free vacuum system. Accessories: Sources of tungsten deposition, GIS adapter to the EDS inlet, a source of carbon deposition, two sources (C and XeF2) that allow the selective attack of the sample, a Peltier stage, a heating stage, a kit control for Peltier and heating plates, a detector amplifier with two channels, a backscattered solid state electron detector for low potential, a STEM solid state detector, an infrared camera, AutoFIB system and Auto TEM for sample preparation , a system of autorebanado and vision, software Amira of reconstruction three-dimensional), a panel of manual control, a kit of portaamuestras, cylinder Wehnelt and openings, a picoamperímetro Keithley and a compressor 220 V. |
TEP120 |
EBIC / CL detection system incorporated to the scanning electron microscope JSM-820-A. Picoamplifier (sensitivity: 10-12 A to 100 KHz) Matelect (model ISM-5A) and Matelect Picoamplifier Control Unit (mod. 1). Spectrograph / Monochromator 1/8 m Oriel (mod 77400), including diffraction gratings of 1200 lines / mm (200-1250 nm) (Oriel, mod 77411) and 600 lines / mm (450-2500 nm) (Oriel, mod 77263); Parabolic mirror (2 semiparabolas) optical quality / 10; Manipulator x-y-z (MDC, mod E-PMS-1504) and mechanics of detection-focusing-direction of the cathodoluminiscence; Quartz lens Melles Griot (01 LQP 007); Germanium detector (E0-817L Equipements Scientifiques, 800-1700 nm, cryostat); CCD SDS9000 Photometrics 1024×256 pixels, 180-1100 nm, cryostat); Software / Control hardware Picoamplifier, Spectrograph / Monochromator 1/8 m, CCD (MAPS) and data acquisition. |
TEP120 |
Nanotec Atomic Force Microscope |
TEP243 |
Sample holder for electronic tomography: Model 2030 Ultra-Narrow Gap Tomography Holder. Fischione. |
FQM334 |
Anaerobic glove chamber for the preparation of transmission electron microscopy samples. |
FQM334 |
Additional equipment for ultramicrotomy of materials: Leica EM KM R2 |
FQM334 |
Trim Additional equipment for ultramicrotomy of materials: Trimer Leica EM Trim |
FQM334 |
Equipment for the preparation of supported metal catalysts: TIM 856 Titration Manager, and is of the Radiometer Analytical brand. |
FQM334 |
System for the treatment of electron microscopy samples with anaerobic transfer to the microscope. |
FQM334 |
Ultramicrotome for the preparation of sections of electron-transparent materials – Leica EM UC6 |
FQM334 |
Ultramicrotome for the preparation of sections of electron-transparent materials Leica Ultracut R |
FQM334 |
Ion Thinner, Dual Ion Mill, Gatan brand, equipped with two cryogenic stations and two laser terminators, model 600 TMP. |
TEP120 |
Precision ionic thinner PIPS Gatan mod 691. Low voltage system for ion thinning of electron-transparent samples for study in the transmission electron microscope. |
TEP120 |
Digital image acquisition system installed in the electronic microscope JEM-2000-EX. Slow-motion camera SSC, Gatan brand (model 679/5), with CCD of 515 x 512 pixels (19 x 19 m pixel size) ), Acquisition Card and Digital Micrograph Software (ref 679-9000) adapted to an Apple Macintosh. Video printer (Seikosha: mod VP-3500) with 1280×1240 resolution pixels and 64 shades of gray. |
TEP120 |
MECHANICAL AND SUPERFICIAL CHARACTERIZATIONS |
Investigation Group |
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Dilatronic dilator of Theta Inst. Equipped with a LVDT dilaflex 2. Study of the coefficient of thermal expansion. Shrinkage analysis of gels and ceramics as a function of temperature. |
TEP115 |
2 Micrometers Mitutoyo mod 1D-C125B. |
TEP120 |
2 INSTRON 8801 dynamic test machines, load cell capacity 50 kN and 100 kN. The oil pressure is controlled by servo electronic valves that help to amplify the power. It has a mobile bridge with two columns and a mobile piston in a range of +/- 150 mm. It has a flow of 40 l / min, corresponds to the maximum capacity of its generation, this allows us to carry out fatigue tests at a high frequency, thus decreasing the testing time. It is equipped with an LVDT type connector, which provides a data output to the control system that represents the current position of the piston. Identifies the response signal as a response position of the sample tested. |
TEP120 |
Dynamic testing machine SUZPECAR equipped with INSTRON electronics, load cell capacity 100 kN. This machine performs fatigue tests, with little range of motion. It is composed of a mobile bridge (extra long) of 4 columns. Traction tests in short range of displacement. |
TEP120 |
Shimadzu Universal Testing Machine of 100 kN. It allows the performance of standard tests of traction, compression, shearing and folding of materials. |
TEP120 |
Universal testing machine SHIMADZU 50kN AG-X table-top, with devices for compression and bending at three points and extensometers for traction. |
TEP946 |
Bending test machines with 3 and 4 points, up to 200kN, for large beams. |
TEP946 |
Struers Duramin 20 microhardness tester. Allows measurements of microhardness from HV 0.01 to HV 2. |
TEP120 |
Durómetro SHORE A y D, HILDEBRAND DUROMETER OPERATING STAND Model OS-2. |
TEP946 |
Shimadzu Universal Testing Machine of 5 kN. Equipped for standard compression tests, bending at three points and adapter for indentation (Vickers and Knoop). Accessory: micrometric XY table. |
TEP115 |
Nanoindentator Nanotest of Micromaterials of 500 mN of vertical pendulum. Equipped with Berkovich pyramidal tip (100 nm), 10X optical objective, controlled temperature and humidity and anti-vibration table. |
TEP115 |
Propagation Speed Measurement System of US Ultrasonic Tester BP-5 |
TEP243 |
Perforation Resistance Testing Equipment (DRMS – Drilling Resistance Measurement System). |
TEP243 |
Salt fog camera |
TEP243 |
Optical profilometer Reference UNCA10-1E-1001. |
FQM154 |
Optical contact angle measuring device OCA 15 Plus. |
TEP243 |
Mechanical Profiler Veeco 150D |
FQM154 |
SD2300 PLASMOS ellipsometer with He-Ne laser. Thick sheet thickness calculation, refractive index and absorption coefficient. |
TEP115 |
Si wafer carburization system. The carburization system consists of a CVD (chemical vapor deposition) furnace that can reach temperatures of 1300ºC and heating rates of samples of the order of 50ºC / s. The use of gas mixtures (propane + hydrogen for carburization) allows the formation of SiC epitaxial layers on Si substrates of a few nanometers for optomicroelectronic applications. In general, this structure is used as a substrate to grow III-N alloys (visible light emitting devices) or SiC (with precursor silane) for microelectronic applications (transistors or Schottky diodes). |
TEP120 |
2 Dispositivos para el estudio de actividad catalítica. Equipados con Cromatógrafo de Gases y Sistema Digital de Adquisición de datos para el análisis de los productos de reacción. Los equipos cuentan igualmente con controlador/programador de temperatura, y reguladores de flujo másico. Estudios de actividad catalítica en procesos que se realizan tanto en fase gaseosa como en disolución. |
FQM110 |
2 Devices for the study of catalytic activity. Equipped with Gas Chromatograph and Digital Data Acquisition System for the analysis of reaction products. The equipment also has a temperature controller / programmer and mass flow regulators. Studies of catalytic activity in processes that are carried out both in gas phase and in solution. |
FQM110 |
Durometer CENTAUR RB2 |
TEP243 |
System for measuring water properties in porous materials Acuasor. Fully automated own design team. It allows to measure the following properties: water absorption by capillarity and by immersion, sorption of water vapor, permeability to steam and desorption or evaporation. |
FQM166 |
Two porosimeters of Hg, Pascal 140 and Pascal 440 of Fisons Instruments. Study of the intrusion / extrusion of mercury under pressure of 100 and 400 Mpa, respectively. Study of the viscoelasticity and rigidity module in gels and ceramics. |
TEP115 |
Automatic permeability measurement equipment. |
TEP243 |
Poremaster mercury intrusion porosimeter from Quantachrome Instruments. |
TEP243 |
Nitrogen Fisisorción Autosorb iQ Quantachrome Instruments. |
TEP243 |
Porosity Measurement System Accessible to Water. |
TEP243 |
OPTICS AND OPTOMECHANICS |
Investigation Group |
Láser continuo 6W Coherent Verdi 6V 532 nm. |
FQM154 |
Argon Omnichrome Laser, Model 543-AP. Tuneable laser, whose most intense lines are 488 nm and 514 nm. The maximum power is approximately 120 mW. |
FQM154 |
Laser of He-Ne Siemens. Laser wavelength 632.8 nm, whose maximum power is approximately 40 mW. |
FQM154 |
Spectral Products Spectral Lighting Source. Based on an ASB-175 emitter with a 175w Xe lamp with the possibility of filtering, coupled to a CM110 monochromator with a double diffraction grating (300 and 1200 lines / mm) |
FQM166 |
Abet Technologies solar simulator. Baado in a lamp of Xe of 150 w, allows to illuminate uniformly surfaces of 2×2 cm2 |
FQM166 |
Tunable diode laser with central emission at 900nm and 800mw of continuous emission. It allows its adaptation to the LBIC equipment for the study of photoconverting properties in the IR zone. Its modularity and its output through fiber optic cable, allows its adaptation to any optomechanical equipment. |
FQM166 |
DPSS laser. Nd / YAG laser, pumped by a diode laser, with emission bent at 532 nm and a maximum output power of 50 mW. |
FQM166 |
High power laser Nd: YAG pulsed (8 ns at 10Hz). Monochromator, lock-in amplifier, Ge photodiode, optical shutter. Photoluminescence study and auto-focus / auto-defocus for the study of nonlinear optical properties. |
TEP115 |
UV Radiation Chamber CN-15LC |
TEP243 |
Electronics and varied optics, both polarization and non-polarization. |
FQM154 |
Etapas de microposicionamiento Newport (M-URM 100CC, M-BGM 80CC, M-VP 25XA) |
FQM154 |
Pneumatized optical table 3×1.5 m2 |
FQM154 |
Breadboard and optomechanical elements. TMC and OWIS optical panels with honeycomb structure of M6 threaded holes. Along with a large number of optomechanical elements such as optical rails, micrometric platforms, optical elements, sliding positioners, etc., allow the design and assembly of complex optomechanical experiments. |
FQM166 |
Nikon FM reflex camera 10. Acquisition of images in photographic support. It has an adapter for its incorporation into optical microscopy systems. |
FQM166 |
Nikon Coolpix 995 3Mb digital photo camera with adapter for coupling to high and low resolution optical microscopy systems. |
FQM166 |
Digital camera (CCD). COHU-4910; and “software” SEMPER 6+, for the digital processing of HREM images. Interpretation of HREM images of multicomponent / multiphase catalysts and other polycrystalline materials. |
FQM334 |
Digital Camera (CCD). KAPPA-DX20L and image acquisition software. Interpretation of HREM images of multicomponent / multiphase catalysts and other polycrystalline materials. |
FQM334 |
Polaroid negative scanner SprintScan 120. Resolution 4000 dpi. Digitization of electron microscopy negatives for further analysis. |
TEP120 |
COMPUTERS AND COMPUTER SYSTEMS |
Investigation Group |
Silicon Graphics Workstation, Model FUEL MIPS R14000. Computer simulation of HREM images. Interpretation of HREM experimental images. |
FQM334 |
Silicon Graphics Workstation, Model INDY 4400SC. Software: EMS and Programs developed in our laboratory (RHODIUS, and AXIS Z). Computer simulation of HREM images (High Resolution Electron Microscopy). Interpretation of experimental HREM images of multicomponent / multiphase catalysts and other polycrystalline materials. |
TEP120 |
Silicon Graphics O2 Graphic Workstation. This machine is dedicated to the calculation of transmission electron microscopy images in both conventional and high resolution modes |
TEP120 |
Hewlett-Packard supercomputer, equipped with 80 HP Proliant BL460c nodes based on the Intel® Xeon ™ 5160 processor series (quad core, 3.00 GHz / 1333). The device calculates up to 3.8 Teraflops with 592 GB of total system memory and 2.4 TB of hard disk. |
TEP120 |
Own development software for Electronic Microscopy: EJEZ (web version: https://www2.uca.es/dept/cmat_qinor/catalisis/tem-uca-server.htm |
FQM334 |
Own development software for Electronic Microscopy: Rhodius (web version: https://www2.uca.es/dept/cmat_qinor/catalisis/tem-uca-server.htm) |
FQM334 |
Software for DFT calculations: CPMD (Carr – Parrinello Molecular Dynamics) |
FQM334 |
Software for DFT calculations: Wien-2k |
FQM334 |
Software for Electronic Microscopy: TEM (E.J. Kirkland) |
FQM334 |
Software for Electronic Microscopy: JEMS (P. Stadelmann) |
FQM334 |
Software for visualization and 3D analysis: Amira |
FQM334 |
Software for Electronic Tomography: Inspect 3D |
FQM334 |
Various programmable systems for data acquisition. With a resolution of 12 bits and with the ability to work autonomously or dependent on a computer, they allow the acquisition of multichannel data. |
FQM166 |
MAGNETIC CHARACTERIZATIONS |
Investigation Group |
Faraday magneto-optical effect measuring system (MOFE). Measurement of the rotation of the plane of polarization of light (monochromatic) when crossing a material subjected to a magnetic field, which can be varied between ± 0.3 T. It can be adapted to the measurement of the magneto-optical effect Kerr (MOKE) , that is, the measure of the rotation of the plane of polarization of the light when reflected in a material subjected to the action of the magnetic field. |
FQM335 |
Faraday Magneto-Optical Effect Measurement System. This equipment operates with lasers of different wavelengths (400-780 nm) and magnetic fields of up to 0.3 T. |
FQM335 |
Hysteresis cycle measuring equipment with LakeShore Model 480 flowmeter. Obtaining magnetization curves and hysteresis cycles of ferromagnetic materials in the form of wire, sheet or powder. |
FQM335 |
Equipment of magneto-electric measurements. Magneto-resistance measurements, Hall effect, electrical resistivity (at variable temperature and magnetic field). |
FQM335 |
Faraday Scale Oxford Instruments with 1 T max electromagnet, liquid N2 cryostat and tubular furnace up to 1000 K. Magnetic susceptibility and magnetization measurements as a function of temperature and magnetic field. Hysteresis cycles. |
FQM335 |
Vibrating Sample Magnetometer (VSM). The financing granted in this case is 170000 euros (119000 euros of ERDF aid) |
FQM335 |
ELECTRICAL AND ELECTRONIC SYSTEMS |
Investigation Group |
Keithley 2000 digital multimeter. Allows measurement of electrical conduction properties with high precision |
FQM166 |
Proman 40MHz two-channel oscilloscope. Signal control in all data collection equipment. |
FQM166 |
Oscilloscope-Data collector Agilen Technologies MSO6054A. It works with a bandwidth of 500MHz and a data capture of 4 GS / s |
FQM166 |
Keithley 2601 digital source-meter unit. Allows the measurement of I-V properties in semiconductors and photosensitive systems |
FQM166 |
OTHER EQUIPMENT |
Investigation Group |
4 High Vacuum Systems. They are equipped for the measurement of pressures from 1000 Torr to 1×10-7 Torr. The following are used: a) For the preparation of polycrystalline powder materials under well controlled conditions of temperature and pressure of inert or chemically active gases. b) In FTIR spectroscopy studies of adsorbed phases, by connecting them to special cells with which they are counted. c) In adsorption and desorption studies, the latter by its coupling to a mass spectrometer or TCD type detector. |
FQM110 |
Edwards E306A evaporation system. This vacuum deposition system is used for the production of amorphous thin sheets and thin metal sheets. |
FQM154 |
Particle size meter, Malvern Zetasizer Nanoseries. It allows to measure the particle size distribution by DLS in the range 0.5-3000 nm. |
FQM166 |
Viscometer Brookfield DV-II+ |
TEP243 |
Balance SARTORIUS AZ124. |
TEP243 |
Balance SARTORIUS BP610. |
TEP243 |
BalanceCOBOS UX6200H. |
TEP243 |
Quantachrome Instruments Helium Ultrapyc 1200e Ultrapicnometer. |
TEP243 |
Dipcoating |
TEP243 |